We are pleased to share a new conference contribution presented at the 2025 IEEE 26th Latin American Test Symposium (LATS):
“Special Session: D-MATE: A Design Methodology for Connecting Automatic Test Equipment in Industry 4.0” by Francesco Biondani, Francesco Tosoni, Nicola Dall’Ora, Enrico Fraccaroli, Sara Vinco, Dong Seon Cheng, and Franco Fummi.
Abstract
The growing presence of semiconductor devices in healthcare, automotive, and consumer electronics has increased the importance of Automatic Test Equipment (ATE) systems for ensuring quality and reliability. However, ATE systems often operate in isolation from other manufacturing processes, limiting interoperability and integration within Industry 4.0.
To bridge this gap, we propose adopting Open Platform Communications Unified Architecture (OPC UA) with a tailored specification for ATE systems. We developed and validated an information model on an advanced ATE system and demonstrated its integration into an Industrial Computer Engineering (ICE) laboratory demonstrator. The results validate the model’s effectiveness and highlight the practical applicability of our integration approach in Industry 4.0 contexts.
Details
- Title: Special Session: D-MATE: A Design Methodology for Connecting Automatic Test Equipment in Industry 4.0
- Authors: Francesco Biondani, Francesco Tosoni, Nicola Dall’Ora, Enrico Fraccaroli, Sara Vinco, Dong Seon Cheng, Franco Fummi
- Conference: 2025 IEEE 26th Latin American Test Symposium (LATS)
- Year: 2025
- Pages: 1-6
Links
- DOI: 10.1109/LATS65346.2025.10963954
- Open Access Version: Read Here
This work demonstrates a practical OPC UA–based information model for ATE integration and validates it in a real demonstrator. We thank all collaborators for their contributions.